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Ultrasonic microscope Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Ultrasonic microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 日本バーンズ 東京本社 Tokyo//Trading company/Wholesale
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
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  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 5 明治電機工業 Aichi//Trading company/Wholesale
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Ultrasonic microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. High-precision ultrasonic microscope 'D9600 C-SAM' 日本バーンズ 東京本社
  2. [C-SAM] Ultrasonic Microscopy Method 一般財団法人材料科学技術振興財団　MST
  3. Introduction to Ultrasonic Microscopy (Principle and Features)
  4. 4 Ultrasonic Microscope 'Gen6'
  5. 5 Ultrasonic Microscope 'SAM' アイテス

Ultrasonic microscope Product List

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Ultrasonic Microscope 'SAM'

Ultrasonic Microscope 'SAM'

Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!

We would like to introduce our ultrasonic microscope, the SAM (Scanning Acoustic Microscope). It is highly effective in detecting defects in the internal conditions and adhesion states of semiconductor packages, substrates, and electronic components. Observation can be performed non-destructively, and defects such as delamination can be detected from the reflected waves of the ultrasonic waves incident on the sample. 【Specifications (excerpt)】 ■ Pulse Receiver: 500MHz ■ Observation Methods: Compatible with both reflection and transmission methods ■ Acoustic Lenses / Reflection Method: 15, 25, 30, 50, 80, 100, 230MHz ■ Acoustic Lenses / Transmission Method: 15, 25, 30, 50, 100MHz *For more details, please refer to the PDF document or feel free to contact us.

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[C-SAM] Ultrasonic Microscopy Method

[C-SAM] Ultrasonic Microscopy Method

C-SAM is a non-destructive method for observing defects such as delamination within a sample.

C-SAM is also known as SAT: Scanning Acoustic Tomography. - It is effective for confirming the "bonding state of electrodes" and "adhesion of bonded wafers," which are difficult to verify with X-ray CT observations. - In addition to reflected waves, transmission waves can also be acquired.

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  • Circuit board design and manufacturing

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High-precision ultrasonic microscope 'D9600 C-SAM'

High-precision ultrasonic microscope 'D9600 C-SAM'

A high-precision ultrasonic microscope that conducts inspection and analysis tasks quickly and accurately! It allows for non-destructive observation of the internal conditions of samples!

The "D9600 C-SAM" is a standard model product from Sonoscan, a company that boasts a world-leading share in ultrasonic microscopy. It captures and images the reflected ultrasonic waves emitted by a transducer at a constant depth (focus) within the sample, allowing for non-destructive observation of the internal conditions of the sample. Different bonding surfaces of materials and areas with air layers exhibit unique reflections, enabling the detection of subtle differences compared to normal areas through accurate measurement and analysis. 【Features】 ■ Equipped with a linear motor scanner ■ Standard scan reference included ■ Capable of detecting and imaging even weak signal waveform changes within the gate with higher sensitivity ■ Supports multilingual display including Japanese, English, and Chinese ■ Can simultaneously scan multiple different depths ■ Capable of measuring up to 100 gates *For more details, please request documentation or view the PDF data available for download.

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High-precision ultrasonic microscope "Gen6"

High-precision ultrasonic microscope "Gen6"

Supports analysis that makes it difficult to separate interface waveforms of each layer! Also compatible with multilingual display.

The "Gen6" is a high-precision ultrasonic microscope that can detect even weak signal waveform changes within the gate with higher sensitivity and is capable of imaging. It can simultaneously scan multiple depths and can measure up to 100 gates. Furthermore, with the inclusion of the "SonoSimulator," it supports the analysis of stack dies and thin-film multilayer samples, where it is difficult to separate the interface waveforms of each layer. 【Features】 ■ High-speed sampling rate ■ Water recirculation system ■ Equipped with PolyGate function ■ Standard scan and reference included ■ Compatible with Windows 7 (64bit) Company Name: Japan Burns Co., Ltd. *For more details, please refer to the PDF document or feel free to contact us.

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